Advantest will present new IC test solutions at SEMICON China 2025 in Shanghai.

From GlobeNewswire: 2025-03-18 03:05:00

Advantest Corporation will showcase its latest test solutions at SEMICON China 2025 in Shanghai, including the T5801 Ultra-High-Speed DRAM test system and new solutions for the V93000 EXA Scale test system. The company will also feature the T2000 SoC test systems, T6391 test system, ACS TE-Cloud™, and ACS Real-Time Data Infrastructure. Advantest speakers will participate in SEMICON China’s technical program, presenting on various topics. For updates, visit Advantest’s Facebook and LinkedIn pages. Advantest is a leading manufacturer of automatic test and measurement equipment for semiconductor applications worldwide. More information available at www.advantest.com.



Read more at GlobeNewswire: Advantest to Showcase Latest IC Test Solutions at SEMICON